Towards in-process x-ray CT for dimensional metrology
نویسندگان
چکیده
منابع مشابه
Towards in-process x-ray CT for dimensional metrology
X-ray computed tomography (CT) offers significant potential as a metrological tool, given the wealth of internal and external data that can be captured, much of which is inaccessible to conventional optical and tactile coordinate measurement machines (CMM). Typical lab-based CT can take upwards of 30 min to produce a 3D model of an object, making it unsuitable for volume production inspection a...
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X-ray computed tomography (CT) enables the visualisation and dimensional evaluation of both the internal and external geometry of a workpiece, it is therefore well suited for measuring geometric features that are otherwise inaccessible to tactile and optical instruments. Beam hardening is a wellknown physical process that can degrade the quality of CT images and influence edge detection algorit...
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X-ray computed tomography (CT) is a non-destructive, radiographic scanning technique that enables the visualisation and dimensional evaluation of both internal and external features of a workpiece; it is therefore an attractive alternative for measurement tasks that prove problematic for conventional tactile and optical instruments. The data output of a CT measurement is a volume of grey value ...
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ژورنال
عنوان ژورنال: Measurement Science and Technology
سال: 2016
ISSN: 0957-0233,1361-6501
DOI: 10.1088/0957-0233/27/3/035401